| Component level MDA test and circuit level ATE test can do in the same platform at the same time to save the man hour in test station. |
| Cost effective :integrated MDA module and function module at any time you want to realize your complicated test work. |
| Both MDA and ATE automatic switch, additional fixture isolation does not require. |
| Security :your already exist function module can integrated as a partial of this system through software or hardware linking. You need not to tell us the detail technique about you products. |
| Flexibility: you can bundle any test module from current system easily upon you products innovation. You can update your system just in time. |
| Nature graphic simulation interface, so that you can debug your test program very easily. |
| Oracle Data base architecture, users can program their special facilities/functions by their own without modify the system software. |
|
Standard Configuration: |
256 channels |
||||
|
Maximum Points:
|
1024 (65536 - customized) |
||||
| Isolation points: | 10 per test step, automatic learning isolation | ||||
| Conventional signal source: |
DCV:±10mV~±7.5V or 15V ACV:10mVpp~10Vpp ACDVI:10u~20mA |
||||
| Test frequency: | 100Hz, 1000Hz, 10KHz, 100KHz, 2MHz (50Hz) | ||||
| Test step: | no limit | ||||
| Component test: | 1~40 ms | ||||
| O/S test: | 0,5~102 s | ||||
| Test scope: | resistance(0.052~100МΩ (2-wire type),1~5% (4-wire type) 10мΩ), capacitance(1pF~40mF±2%~5%), inductance(1uH~50H±2%~5%) | ||||
| Testing components: | diodes (0.1~9 V±1%~3%), zener diodes (0.1~15 V±1%~3%), transistors (Vce saturation voltage and B value are tested in three stages), field-effect transistors (Vds.Cds&Rd（on)), Optical coupler and power failure organ (The four terminals test their on-voltage or resistance) | ||||
| Testing microresistors(4-wire type): | minimum 50mQ (4-wire)±10mΩ | ||||
| Key press function: | during the key test, the program is suspended, and manual operation is used to detect whether the key is good or bad | ||||
| Automatic stamp: | test PASS or Fail automatic stamping equipment | ||||
| Monitor placement: | monitoring placement orientation (PASS or Fail shunt) | ||||
| First pass yield surveillance: | When the first pass yield < X is the alarm bell and < Y is the alarm bell, stop the line inspection | ||||
| Graphic function: | board Vvew and automatic production of board view | ||||
| Test data archiving: | save the test data selection items & barcode scanning | ||||
| Impedance series-parallel connection: | using multi-frequency test and phase separation method (8 ~82 degrees) | ||||
| Polarity of electrolytic capacitor and leakage detection technology: | three-terminal characteristic discrimination comparison technology test and two-terminal leakage current test | ||||
| Hardware protection function: |
infrared protection function |
||||
| Operating system: | Windows XP | ||||
| Computer configuration: | CPU: Dual Core 2.8+Memory: 2GB/ Hard Disk: 1000G+G | ||||
| Monitor: | 19” | ||||
| Printer: | Epson Bill | ||||
| Machine size (LхWхH): | 1000х750х1600 mm (machine size can be customized according to customer requirements) | ||||
| Circuit board dimensions: | 500х350 mm | ||||
| Air pressure Requirement: | 3~6 bar | ||||
| Working temperature: | 0~+45℃ | ||||
| Working humidity: | 10-90% | ||||
| Power supply: | 1 фаза, 220 В , 50 Гц | ||||
| Weight: | 300 kg | ||||
.png "Digital microscope Inspex HD Table GRIDS — СМТ Технологии")
.png "Desktop digital video-microscope Inspex HD Vesa GRIDS — СМТ Технологии")
 (1).png "ICT TESTER QBS-Q518 — СМТ Технологии")
